Articles | Volume SpecialIssue
https://doi.org/10.2204/iodp.sd.s01.04.2007
© Author(s) 2007. This work is distributed under
the Creative Commons Attribution 3.0 License.
the Creative Commons Attribution 3.0 License.
https://doi.org/10.2204/iodp.sd.s01.04.2007
© Author(s) 2007. This work is distributed under
the Creative Commons Attribution 3.0 License.
the Creative Commons Attribution 3.0 License.
01 Nov 2007
Seismology inside the Fault Zone: Applications to Fault-Zone Properties and Rupture Dynamics
W. L. Ellsworth
3A-109, U.S. Geological Survey (USGS), 345 Middlefield Road Mail Stop 977, Menlo Park, Calif. 94025, USA
P. E. Malin
109A Old Chemistry Box 90227, Duke University, Durham, N.C. 27708, USA
K. Imanishi
Geological Survey of Japan, Institute of Geology and Geoinformation (AIST), Tsukuba Central 7, 1-1-1 Higashi, Tsukuba, 305-8567, Japan
S. W. Roecker
Department of Earth and Environmental Sciences, Rensselaer Polytechnic Institute, Science Center 1S06, Troy, N.Y. 12180, USA
R. Nadeau
Berkeley Seismological Lab., 207 McCone Hall, University of California Berkeley, Calif. 94720-4760, USA
V. Oye
Norwegian Seismic Array (NORSAR), P.O. Box 53, N-2027 Kjeller, Norway
C. H. Thurber
Department of Geology and Geophysics, University of Wisconsin, 1215 West Dayton Street, Madison, Wis. 53706, USA
F. Waldhauser
LDEO-Seismology Geology and Tectonophysics, 210 Seismology, 61 Route 9W – P.O. Box 1000, Palisades, N.Y. 10964, USA
N. L. Boness
Chevron, Energy Technology Centers (ETC), San Ramon, Calif. 94583, USA
S. H. Hickman
USGS, 345 Middlefield Road, Menlo Park, Calif. 94025, USA
M. D. Zoback
Department of Geophysics, Stanford University, Mitchell Bldg., Stanford, Calif. 94305, USA
Abstract. No abstract available.
doi:10.2204/iodp.sd.s01.04.2007
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How to cite. Ellsworth, W. L., Malin, P. E., Imanishi, K., Roecker, S. W., Nadeau, R., Oye, V., Thurber, C. H., Waldhauser, F., Boness, N. L., Hickman, S. H., and Zoback, M. D.: Seismology inside the Fault Zone: Applications to Fault-Zone Properties and Rupture Dynamics, Sci. Dril., SpecialIssue, 84–87, https://doi.org/10.2204/iodp.sd.s01.04.2007, 2007.